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Laser Diode Test System - メーカー・企業と製品の一覧

Laser Diode Test Systemの製品一覧

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Laser Diode Test System [LD342L/S-LT/NT]

Laser Diode Test System [LD342L/S-LT/NT]

This is a desktop LD test system for research and development purposes that can semi-automatically measure the characteristics of laser diodes.

This is a desktop-type LD test system for research purposes. <Features> ■ Dedicated fixtures can be prepared according to the shape of the LD. ■ Measurement items (Front LIV, λ characteristics, FFP H, V) can be automatically measured for one element under specified temperature conditions. ■ There are LD342L for long wavelengths (1200-1650nm) and LD342S for short wavelengths (400-980nm). ■ Options are available for low temperature (from -40°C to +100°C) LT and room temperature (from 20°C to +100°C) NT. ■ The adoption of a focusing lens system eliminates the need for wavelength measurement alignment.

  • Analytical Equipment and Devices

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Laser Diode Test System [LD2920MTB]

Laser Diode Test System [LD2920MTB]

Achieve an efficient configuration targeting communication LDs! LD chips can be stored in a gripping state, allowing for high-speed automatic measurement.

This device is an LD test system that automatically measures and sorts the electrical and optical characteristics of long-wavelength (optical communication) laser diode bare chips at high speed. <Features> ■ LD chips adhered to a blue sheet are supplied and automatically transported at high speed from gripping ring state to measurement and classification. ■ Measurement items (front/back LIV, λ characteristics) can be measured as standard items under two temperature environments. ■ Measurement sorting can be performed at any temperature from -40°C to +95°C. ■ Simultaneous IL measurement of FRONT light and BACK light is possible. ■ The SH gauging method is adopted for chip positioning. ■ The use of a focusing lens system has eliminated the alignment time for wavelength measurement. ■ Up to 13 cameras monitor the presence and condition of LD chips at each position, making it easy to understand operating conditions and adjust various parts. *For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices

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Laser Diode Test System

Laser Diode Test System

We can perform I-L/I-V measurements, FFP (Far Field Pattern) measurements, and polarization ratio measurements.

Introducing the "Laser Diode Test System" handled by Fukuhara System. This product is capable of performing I-L/I-V measurements, spectrum measurements, FFP (Far Field Pattern) measurements, polarization ratio measurements, and more. The operation is interactive with a menu-based system. Additionally, the display section features a 5.6-inch LCD. 【The following measurements are possible】 (1) I-L/I-V measurement (2) FFP (Far Field Pattern) measurement (3) Spectrum measurement *Requires an optical spectrum analyzer (4) Polarization ratio measurement (5) Temperature dependence evaluation for (1) to (4) (6) Light output/driving current dependence evaluation for (2), (3), and (4) *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Laser Diode Test System [LD2920TB]

Laser Diode Test System [LD2920TB]

Achieve an efficient configuration targeting communication LDs! LD chips can be stored in a gripping state.

This is an LD test system that automatically and rapidly measures and sorts the electrical and optical characteristics of long-wavelength laser diodes in bare chip condition. <Features> ■ Fully automated transport from supply to measurement and classification ■ Easy monitoring of operating conditions with up to 13 cameras ■ Capable of measuring at any temperature from +20°C to -100°C ■ Simultaneous IL measurement of FRONT light and BACK light. For more details, please download the PDF or feel free to contact us.

  • Analytical Equipment and Devices

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